Title:
Potential-induced degradation of photovoltaic modules fabricated using flat mono-crystalline silicon cells with different surface orientations

Speaker:
Seira Yamaguchi (JAIST)

Abstract:
This paper deals with the behavior of the potential-induced degradation (PID) of photovoltaic modules fabricated using p-type flat mono-crystalline silicon cells with (100) and (111) surface orientations. PID tests are performed by applying a voltage of -1000 V to con-nected interconnector ribbons of the modules. A decrease in the normalized maximum power of the modules with (100)-oriented cells is more significant than that with (111)-oriented cells, implying that the (111)-oriented cells have the higher PID resistance.